When Test Equipment and Auto Test Equipment (ATE) systems are used to test discrete semiconductors they often require a switching device that can carry high-pulsed currents that do not distort the pulsed current. These pulsed currents are used to verify the device under test can handle high and/or surge currents without any degradation in performance. The high current pulse verifies that the chip is adequately bonded to its substrate. Also, at the same time, high voltages may be needed to hold off high switching voltages as well. Using reed relays achieves the goal of billions of successful pulsed operations.
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